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101
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DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
101
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ISVLSI
2007
IEEE
15 years 6 months ago
2007
IEEE
In sub-90nm technologies, more frequent hard faults pose a serious burden on processor design and yield control. In addition to manufacturing-time chip repair schemes, microarchit...
ISQED
2005
IEEE
15 years 5 months ago
2005
IEEE
As the scale and complexity of VLSI circuits increase, Electronic Design Automation (EDA) tools become much more sophisticated and are held to increasing standards of quality. New...
ISLPED
2006
ACM
15 years 5 months ago
2006
ACM
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
112
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PIMRC
2010
IEEE
14 years 9 months ago
2010
IEEE
Abstract--Troubleshooting of wireless networks is a challenging network management task. We have developed, in a previous work, a new troubleshooting methodology, which we named St...