340 search results - page 47 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
118
click to vote
JCB
2006
14 years 11 months ago
2006
Biological systems are traditionally studied by focusing on a specific subsystem, building an intuitive model for it, and refining the model using results from carefully designed ...
DAC
2006
ACM
16 years 24 days ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
ISVLSI
2007
IEEE
15 years 6 months ago
2007
IEEE
This paper presents a two-stage CMOS differential voltage-controlled ring oscillator (VCO). The VCO is intended to operate as a frequency synthesizer in a PLL to generate local os...
ASPDAC
2006
ACM
15 years 5 months ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
TCAD
2008
14 years 11 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...