340 search results - page 60 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
DFT
2005
IEEE
15 years 5 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
103
click to vote
DAC
2007
ACM
16 years 25 days ago
2007
ACM
Emerging single-chip heterogeneous multiprocessors feature hundreds of design elements contending for shared resources, making it difficult to isolate performance impacts of indiv...
124
click to vote
ISQED
2006
IEEE
15 years 5 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
TON
2008
14 years 11 months ago
2008
This paper presents a methodology for protecting low-priority best-effort (BE) traffic in a network domain that provides both virtual-circuit routing with bandwidth reservation for...
114
click to vote
ISPD
2007
ACM
15 years 1 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...