641 search results - page 17 / 129 » A Study in Coverage-Driven Test Generation |
77
Voted
JSS
2007
14 years 9 months ago
2007
This paper describes an approach for generating customized benchmark suites from a software architecture description following a Model Driven Architecture (MDA) approach. The benc...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
ICST
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
COMPSAC
2006
IEEE
15 years 3 months ago
2006
IEEE
This paper presents an approach for automated test case generation using a software specification modeled in Statecharts. The steps defined in such approach involve: translation o...
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...