641 search results - page 1 / 129 » A Study in Coverage-Driven Test Generation |
81
Voted
DAC
1999
ACM
16 years 6 months ago
1999
ACM
145
Voted
DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
126
Voted
KBSE
1999
IEEE
15 years 9 months ago
1999
IEEE
162
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CORR
2011
Springer
14 years 12 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
122
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PTS
2010
15 years 3 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...