Sciweavers

641 search results - page 21 / 129
» A Study in Coverage-Driven Test Generation
Sort
View
SIMPRA
2010
558views more  SIMPRA 2010»
14 years 8 months ago
Species abundance patterns in an ecosystem simulation studied through Fisher's logseries
We have developed an individual-based evolving predator-prey ecosystem simulation that integrates, for the first time, a complex individual behaviour model, an evolutionary mecha...
Didier Devaurs, Robin Gras
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 4 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
IWANN
2009
Springer
15 years 4 months ago
Aiding Test Case Generation in Temporally Constrained State Based Systems Using Genetic Algorithms
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...
SIGSOFT
2007
ACM
15 years 10 months ago
The impact of input domain reduction on search-based test data generation
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
Mark Harman, Youssef Hassoun, Kiran Lakhotia, Phil...
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
15 years 4 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...