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» A Study in Coverage-Driven Test Generation
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SDL
2001
89views Hardware» more  SDL 2001»
14 years 11 months ago
Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
Dieter Hogrefe, Beat Koch, Helmut Neukirchen
ICCAD
1997
IEEE
147views Hardware» more  ICCAD 1997»
15 years 1 months ago
Built-in test generation for synchronous sequential circuits
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Irith Pomeranz, Sudhakar M. Reddy
FLAIRS
2007
14 years 12 months ago
Pattern-Constrained Test Case Generation
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
Martin Atzmüller, Joachim Baumeister, Frank P...
AOSE
2008
Springer
14 years 11 months ago
Experimental Evaluation of Ontology-Based Test Generation for Multi-agent Systems
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
Cu D. Nguyen, Anna Perini, Paolo Tonella
ECOWS
2008
Springer
14 years 11 months ago
Automatic Timed Test Case Generation for Web Services Composition
In order to specify the composition of Web services, WSBPEL was defined as an orchestrating language by an international standards consortium. In this paper, we propose a method t...
Mounir Lallali, Fatiha Zaïdi, Ana R. Cavalli,...