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DATE
2009
IEEE
148views Hardware» more  DATE 2009»
15 years 4 months ago
A new design-for-test technique for SRAM core-cell stability faults
—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
Alexandre Ney, Luigi Dilillo, Patrick Girard, Serg...
AHS
2006
IEEE
138views Hardware» more  AHS 2006»
15 years 3 months ago
Generalized Disjunction Decomposition for the Evolution of Programmable Logic Array Structures
Evolvable hardware refers to a self reconfigurable electronic circuit, where the circuit configuration is under the control of an evolutionary algorithm. Evolvable hardware has sh...
Emanuele Stomeo, Tatiana Kalganova, Cyrille Lamber...
ASAP
2006
IEEE
168views Hardware» more  ASAP 2006»
15 years 1 months ago
Dual-Processor Design of Energy Efficient Fault-Tolerant System
A popular approach to guarantee fault tolerance in safety-critical applications is to run the application on two processors. A checkpoint is inserted at the completion of the prim...
Shaoxiong Hua, Pushkin R. Pari, Gang Qu
DATE
2006
IEEE
110views Hardware» more  DATE 2006»
15 years 3 months ago
Layout driven data communication optimization for high level synthesis
High level synthesis transformations play a major part in shaping the properties of the final circuit. However, most optimizations are performed without much knowledge of the fina...
Ryan Kastner, Wenrui Gong, Xin Hao, Forrest Brewer...
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ICCAD
2006
IEEE
152views Hardware» more  ICCAD 2006»
15 years 6 months ago
Performance-oriented statistical parameter reduction of parameterized systems via reduced rank regression
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
Zhuo Feng, Peng Li