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ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
14 years 11 months ago
Handling partial correlations in yield prediction
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Sridhar Varadan, Janet Meiling Wang, Jiang Hu
ICCAD
1994
IEEE
144views Hardware» more  ICCAD 1994»
15 years 1 months ago
Power analysis of embedded software: a first step towards software power minimization
Embedded computer systems are characterized by the presence of a dedicated processor and the software that runs on it. Power constraints are increasingly becoming the critical com...
Vivek Tiwari, Sharad Malik, Andrew Wolfe
ICECCS
2010
IEEE
162views Hardware» more  ICECCS 2010»
14 years 9 months ago
A Tile-Based Approach for Self-Assembling Service Compositions
—This paper presents a novel approach to the design of self-adaptive service-oriented applications based on a new model called service tiles. The approach allows designers to dev...
Luca Cavallaro, Elisabetta Di Nitto, Carlo A. Furi...
RTAS
2006
IEEE
15 years 3 months ago
METERG: Measurement-Based End-to-End Performance Estimation Technique in QoS-Capable Multiprocessors
Multiprocessor systems present serious challenges in the design of real-time systems due to the wider variation of execution time of an instruction sequence compared to a uniproce...
Jae W. Lee, Krste Asanovic
DAC
2004
ACM
15 years 10 months ago
Toward a methodology for manufacturability-driven design rule exploration
Resolution enhancement techniques (RET) such as optical proximity correction (OPC) and phase-shift mask (PSM) technology are deployed in modern processes to increase the fidelity ...
Luigi Capodieci, Puneet Gupta, Andrew B. Kahng, De...