7167 search results - page 32 / 1434 » A Technique for Invariant Generation |
SIBGRAPI
2005
IEEE
15 years 7 months ago
2005
IEEE
Generating triangular meshes from images is a task important to many applications. Usually, techniques that can do that either take as starting point a segmented image or generate...
114
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ICCAD
2002
IEEE
15 years 10 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
112
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VLSID
2009
IEEE
16 years 2 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
146
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ISSTA
1998
ACM
15 years 6 months ago
1998
ACM
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
103
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ARVLSI
1995
IEEE
15 years 5 months ago
1995
IEEE
This paper presents an architecture for generating a high-speed data pattern with precise edge placement resolution by using the matched delay technique. The technique involves ...