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111
Voted
ICTAI
2003
IEEE
15 years 7 months ago
2003
IEEE
In multi-instance learning, the training examples are bags composed of instances without labels and the task is to predict the labels of unseen bags through analyzing the training...
100
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DATE
1998
IEEE
15 years 6 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
VTS
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
GECCO
2005
Springer
15 years 7 months ago
2005
Springer
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
109
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ITC
1997
IEEE
15 years 6 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...