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TDSC
2008
15 years 1 months ago
2008
ASPDAC
2010
ACM
15 years 4 hour ago
2010
ACM
139
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ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
14 years 11 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
ACL
2011
14 years 5 months ago
2011
140
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AMFG
2007
IEEE
15 years 6 months ago
2007
IEEE
A key problem for "face in the crowd" recognition from existing surveillance cameras in public spaces (such as mass transit centres) is the issue of pose mismatches betwe...