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ATS
2003
IEEE
75views Hardware» more  ATS 2003»
15 years 2 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
TCAD
2010
130views more  TCAD 2010»
14 years 4 months ago
On ATPG for Multiple Aggressor Crosstalk Faults
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...
Kunal P. Ganeshpure, Sandip Kundu
ASPDAC
2006
ACM
122views Hardware» more  ASPDAC 2006»
15 years 3 months ago
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, ...
VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
15 years 9 months ago
Spectral RTL Test Generation for Microprocessors
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
Nitin Yogi, Vishwani D. Agrawal
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
15 years 2 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham