Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis S...
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
This paper describes an approach to the formalization of existing criteria used in computer systems software testing and proposes a new Reinforced Condition/Decision Coverage (RC/D...
Abstract. So far, model-based testing approaches have mostly been used in testing through various kinds of APIs. In practice, however, testing through a GUI is another equally impo...
Testing can be difficult to integrate into software development. Approaches to software testing in relation to implementing software are based on the V-model of testing. The softw...