In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
Andreas Apostolakis, Dimitris Gizopoulos, Mihalis ...
While the use of test-driven development as a debugging, pedagogic, and analytical methodology for objectoriented and procedural systems is well documented, it is a relatively une...
Tools for generating test queries for databases do not explicitly take into account the actual data in the database. As a consequence, such tools cannot guarantee suitable coverag...
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...
Christopher M. Hayden, Eric A. Hardisty, Michael W...