364 search results - page 15 / 73 » A UML-integrated Test Description Language for Component Tes... |
88
Voted
ICCD
2008
IEEE
15 years 7 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
89
Voted
VTS
2005
IEEE
15 years 4 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
109
Voted
SPIN
2005
Springer
15 years 4 months ago
2005
Springer
Abstract. This paper presents a technique that uses code to automatically generate its own test cases at run-time by using a combination of symbolic and concrete (i.e., regular) ex...
87
Voted
AEI
1999
14 years 10 months ago
1999
Many computer simulations, experimental testing and monitoring of physical systems produce vast amounts of quantitative data. These data have always been assimilated by trained an...
103
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TJS
2002
14 years 10 months ago
2002
The Center for Simulating Dynamic Response of Materials at the California Institute of Technology is constructing a virtual shock physics facility for studying the response of vari...