678 search results - page 15 / 136 » A Universal Framework for Self-Replication |
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
CISIM
2007
IEEE
15 years 4 months ago
2007
IEEE
The standard digital signature scheme can be easily subject to key exposure problem In order to overcome this problem; a feasible and effective approach is employed by key-evolving...
CLEF
2006
Springer
15 years 1 months ago
2006
Springer
We present a report about our participation in the ImageCLEF photo task 2006 and a short description of our new framework for future use in further CLEF participations....
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CLEF
2008
Springer
14 years 11 months ago
2008
Springer
We describe our participation in Multilingual Question Answering at CLEF 2008 using German and English as our source and target languages respectively. The system was built using ...
EUC
2008
Springer
14 years 11 months ago
2008
Springer
Too narrow, the productivity-oriented vision guiding ubiquitous computing should be replaced or enriched with humanistic aspects. We discuss the role of Maslow's hierarchy of...