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KBSE
2005
IEEE
15 years 3 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
87
Voted
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 1 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
PR
2008
228views more  PR 2008»
14 years 9 months ago
Accurate integration of multi-view range images using k-means clustering
3D modelling finds a wide range of applications in industry. However, due to the presence of surface scanning noise, accumulative registration errors, and improper data fusion, re...
Hong Zhou, Yonghuai Liu
CSB
2004
IEEE
112views Bioinformatics» more  CSB 2004»
15 years 1 months ago
Reasoning about Molecular Similarity and Properties
Ascertaining the similarity amongst molecules is a fundamental problem in biology and drug discovery. Since similar molecules tend to have similar biological properties, the notio...
Rahul Singh
ENTCS
2006
146views more  ENTCS 2006»
14 years 9 months ago
Relating State-Based and Process-Based Concurrency through Linear Logic
This paper has the purpose of reviewing some of the established relationships between logic and concurrency, and of exploring new ones. Concurrent and distributed systems are noto...
Iliano Cervesato, Andre Scedrov
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