2395 search results - page 350 / 479 » A comparative study of two object recognition methods |
VTS
2008
IEEE
15 years 4 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
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CVPR
2006
IEEE
15 years 12 months ago
2006
IEEE
We consider the general problem of learning from both labeled and unlabeled data. Given a set of data points, only a few of them are labeled, and the remaining points are unlabele...
PAMI
2010
14 years 8 months ago
2010
—In this paper, we study the problem of segmenting tracked feature point trajectories of multiple moving objects in an image sequence. Using the affine camera model, this proble...
GECCO
2009
Springer
15 years 4 months ago
2009
Springer
Size and complexity of data repositories collaboratively created by Web users generate a need for new processing approaches. In this paper, we study the problem of detection of ...
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BMCBI
2010
14 years 10 months ago
2010
Background: Computational comparison of two protein structures is the starting point of many methods that build on existing knowledge, such as structure modeling (including modeli...