Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
We propose a hierarchy-driven approach to facilitate student learning and foster a deeper understanding of the importance of attack patterns in computer, network, and software sec...
Today’s distributed e-commerce applications typically rely upon various technologies in their realization, including the web, scripting languages, server-side processing and an ...
We present a formal theory of model-based testing, an algorithm for test generation based on it, and outline how testing is implemented by a diagnostic engine. The key to making t...
This paper presents results from analyzing the vulnerability of security-critical software applications to malicious threats and anomalous events using an automated fault injectio...