840 search results - page 84 / 168 » A low-complexity issue logic |
93
Voted
WWW
2003
ACM
16 years 1 months ago
2003
ACM
Model-theoretic semantics is a formal account of the interpretations of legitimate expressions of a language. It is increasingly being used to provide Web markup languages with we...
89
Voted
VLSID
2008
IEEE
16 years 1 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
117
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HPCA
2003
IEEE
16 years 29 days ago
2003
IEEE
With the constant advances in technology that lead to the increasing of the transistor count and processor frequency, power dissipation is becoming one of the major issues in high...
98
Voted
ICCD
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper presents a new scheduling technique to improve the speed, power, and scalability of a dynamic scheduler. In a high-performance superscalar processor, the instruction sc...
101
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ICCAD
2008
IEEE
15 years 9 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...