Dynamic error processing approaches are an important mechanism to increase the reliability in a multiprocessor system, while making efficient use of the available resources. To th...
Andrea Bondavalli, Silvano Chiaradonna, Felicita D...
Based on microarray gene expression datasets, many statistical methods have been proposed to locate the significant differentially expressed genes (marker genes) among different sa...
Atiq Islam, Khan M. Iftekharuddin, David J. Russom...
High-density LSI packages such as ball grid array (BGA) are being utilised in the car electronics and communications infrastructure products. These products require a high-speed a...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...