-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
This paper deals with the problem of spectral reflectance estimation from color camera outputs. Because the reconstruction of such functions is an inverse problem, stabilizing the...
Alamin Mansouri, Jon Yngve Hardeberg, Tadeusz Sliw...
As technology scales down, power supply noise is becoming a performance and reliability bottleneck in modern VLSI. We propose a power supply noise-aware design methodology for hig...
This paper proposes a new statistical model-based likelihood ratio test (LRT) VAD to obtain reliable speech / non-speech decisions. In the proposed method, the likelihood ratio (L...