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» A novel methodology for statistical parameter extraction
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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
15 years 4 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
SIGMOD
2012
ACM
212views Database» more  SIGMOD 2012»
12 years 12 months ago
Local structure and determinism in probabilistic databases
While extensive work has been done on evaluating queries over tuple-independent probabilistic databases, query evaluation over correlated data has received much less attention eve...
Theodoros Rekatsinas, Amol Deshpande, Lise Getoor
76
Voted
ETRA
2010
ACM
197views Biometrics» more  ETRA 2010»
15 years 4 months ago
Image ranking with implicit feedback from eye movements
In order to help users navigate an image search system, one could provide explicit information on a small set of images as to which of them are relevant or not to their task. Thes...
David R. Hardoon, Kitsuchart Pasupa
VLSID
2000
IEEE
90views VLSI» more  VLSID 2000»
15 years 1 months ago
Performance Analysis of Systems with Multi-Channel Communication Architectures
This paper presents a novel system performance analysis technique to support the design of custom communication architectures for System-on-Chip ICs. Our technique fills a gap in...
Kanishka Lahiri, Sujit Dey, Anand Raghunathan
MIR
2005
ACM
141views Multimedia» more  MIR 2005»
15 years 3 months ago
A mutual semantic endorsement approach to image retrieval and context provision
Learning semantics from annotated images to enhance content-based retrieval is an important research direction. In this paper, annotation data are assumed available for only a sub...
Jia Li