Modern algorithms for the SAT problem reveal an almost tractable behavior on “real-world” instances. This is frequently contributed to the fact that these instances possess an ...
This paper presents a chip-level charged device model (CDM) electrostatic discharge (ESD) simulation method. The chip-level simulation is formulated as a DC analysis problem. A ne...
Haifeng Qian, Joseph N. Kozhaya, Sani R. Nassif, S...
Abstract. We present a “memory-model-sensitive” approach to validating correctness properties for multithreaded programs. Our key insight is that by specifying both the inter-t...
Identifying and resolving design problems in the early design phase can help ensure software quality and save costs. There are currently few tools for analyzing designs expressed ...
Lijun Yu, Robert B. France, Indrakshi Ray, Kevin L...
Abstract. We address the problem of learning good features for understanding video data. We introduce a model that learns latent representations of image sequences from pairs of su...