Three-dimensional (3-D) integrated circuits have emerged as promising candidates to overcome the interconnect bottlenecks of nanometer scale designs. While they offer several othe...
Gian Luca Loi, Banit Agrawal, Navin Srivastava, Sh...
Software defects, commonly known as bugs, present a serious challenge for system reliability and dependability. Once a program failure is observed, the debugging activities to loc...
Multihop wireless mesh networks can provide Internet access over a wide area with minimal infrastructure expenditure. In this work, we present a measurement driven deployment stra...
Joseph Camp, Joshua Robinson, Christopher Steger, ...
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...