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143
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VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
136
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ISSRE
2002
IEEE
15 years 8 months ago
2002
IEEE
Object-oriented programs cause a shift in focus from software units to the way software classes and components are connected. Thus, we are finding that we need less emphasis on un...
111
Voted
ICCAD
1996
IEEE
15 years 7 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
149
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ICALP
2007
Springer
15 years 9 months ago
2007
Springer
Abstract. We develop a generic framework for deriving linear-size problem kernels for NP-hard problems on planar graphs. We demonstrate the usefulness of our framework in several c...
136
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SENSYS
2003
ACM
15 years 8 months ago
2003
ACM
Sensor networks not only have the potential to change the way we use, interact with, and view computers, but also the way we use, interact with, and view the world around us. In o...