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ENTCS
2008
95views more  ENTCS 2008»
15 years 3 months ago
Coverage-biased Random Exploration of Models
This paper describes a set of methods for randomly drawing traces in large models either uniformly among all traces, or with a coverage criterion as target. Classical random walk ...
Marie-Claude Gaudel, Alain Denise, Sandrine-Domini...
SP
2006
IEEE
132views Security Privacy» more  SP 2006»
15 years 9 months ago
Towards Automatic Generation of Vulnerability-Based Signatures
In this paper we explore the problem of creating vulnerability signatures. A vulnerability signature matches all exploits of a given vulnerability, even polymorphic or metamorphic...
David Brumley, James Newsome, Dawn Xiaodong Song, ...
DATE
2009
IEEE
93views Hardware» more  DATE 2009»
15 years 10 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
ITC
2003
IEEE
120views Hardware» more  ITC 2003»
15 years 8 months ago
High Quality ATPG for Delay Defects
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
Puneet Gupta, Michael S. Hsiao
DATAMINE
2006
127views more  DATAMINE 2006»
15 years 3 months ago
Computing LTS Regression for Large Data Sets
Least trimmed squares (LTS) regression is based on the subset of h cases (out of n) whose least squares t possesses the smallest sum of squared residuals. The coverage h may be se...
Peter Rousseeuw, Katrien van Driessen