Sciweavers

16404 search results - page 137 / 3281
» A set coverage problem
Sort
View
DATE
2005
IEEE
204views Hardware» more  DATE 2005»
15 years 9 months ago
Evaluation of Error-Resilience for Reliable Compression of Test Data
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
Hamidreza Hashempour, Luca Schiano, Fabrizio Lomba...
115
Voted
VLSID
1998
IEEE
117views VLSI» more  VLSID 1998»
15 years 7 months ago
Partial Scan Selection Based on Dynamic Reachability and Observability Information
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. R...
VTS
1996
IEEE
76views Hardware» more  VTS 1996»
15 years 7 months ago
Test point insertion based on path tracing
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Nur A. Touba, Edward J. McCluskey
LREC
2008
100views Education» more  LREC 2008»
15 years 4 months ago
Knowledge Sources for Bridging Resolution in Multi-Party Dialog
In this paper we investigate the coverage of the two knowledge sources WordNet and Wikipedia for the task of bridging resolution. We report on an annotation experiment which yield...
Mark-Christoph Mueller, Margot Mieskes, Michael St...
COLING
2002
15 years 3 months ago
Syntactic Features for High Precision Word Sense Disambiguation
This paper explores the contribution of a broad range of syntactic features to WSD: grammatical relations coded as the presence of adjuncts/arguments in isolation or as subcategor...
David Martínez, Eneko Agirre, Lluís ...