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HEURISTICS
1998
103views more  HEURISTICS 1998»
15 years 1 months ago
Computing Approximate Solutions of the Maximum Covering Problem with GRASP
We consider the maximum covering problem, a combinatorial optimization problem that arises in many facility location problems. In this problem, a potential facility site covers a s...
Mauricio G. C. Resende
ITC
1995
IEEE
104views Hardware» more  ITC 1995»
15 years 5 months ago
Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
Nur A. Touba, Edward J. McCluskey
ISSRE
2007
IEEE
15 years 3 months ago
Generating Trace-Sets for Model-based Testing
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
Birgitta Lindström, Paul Pettersson, Jeff Off...
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
15 years 7 months ago
Exact Grading of Multiple Path Delay Faults
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
Saravanan Padmanaban, Spyros Tragoudas
KDD
2008
ACM
140views Data Mining» more  KDD 2008»
16 years 2 months ago
Semi-supervised approach to rapid and reliable labeling of large data sets
Supervised classification methods have been shown to be very effective for a large number of applications. They require a training data set whose instances are labeled to indicate...
György J. Simon, Vipin Kumar, Zhi-Li Zhang