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96
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ICECCS
2000
IEEE
106views Hardware» more  ICECCS 2000»
15 years 4 months ago
Evaluation of Three Specification-Based Testing Criteria
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Je...
100
Voted
INFOCOM
2005
IEEE
15 years 6 months ago
Dynamic node activation in networks of rechargeable sensors
— We consider a network of rechargeable sensors, deployed redundantly in a random sensing environment, and address the problem of how sensor nodes should be activated dynamically...
Koushik Kar, Ananth Krishnamurthy, Neeraj Jaggi
107
Voted
VTS
1995
IEEE
100views Hardware» more  VTS 1995»
15 years 4 months ago
Transformed pseudo-random patterns for BIST
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
Nur A. Touba, Edward J. McCluskey
86
Voted
WWW
2007
ACM
16 years 1 months ago
Search engine retrieval of changing information
In this paper we analyze the Web coverage of three search engines, Google, Yahoo and MSN. We conducted a 15 month study collecting 15,770 Web content or information pages linked f...
Yang Sok Kim, Byeong Ho Kang, Paul Compton, Hirosh...
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 6 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...