16404 search results - page 73 / 3281 » A set coverage problem |
AAIM
2005
Springer
15 years 6 months ago
2005
Springer
In this paper we study the set cover games when the elements are selfish agents. In this case, each element has a privately known valuation of receiving the service from the sets,...
161
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ASC
2011
14 years 7 months ago
2011
In the area of data mining, the discovery of valuable changes and connections (e.g., causality) from multiple data sets has been recognized as an important issue. This issue essen...
115
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ATS
2004
IEEE
15 years 4 months ago
2004
IEEE
TIS (Test Instruction Set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replace...
72
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ICCAD
2009
IEEE
14 years 10 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
99
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VLSID
2002
IEEE
16 years 1 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...