88 search results - page 3 / 18 » A succinct memory model for automated design debugging |
DAC
2008
ACM
14 years 7 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
SC
2009
ACM
13 years 11 months ago
2009
ACM
In order to understand the complex physics of mother nature, physicist often use many approximations to understand one area of physics and then write a simulation to reduce these ...
AMOST
2007
ACM
13 years 10 months ago
2007
ACM
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
TSE
2012
11 years 8 months ago
2012
d Abstractions for Contract Validation Guido de Caso, Víctor Braberman, Diego Garbervetsky and Sebastián Uchitel —Pre/post condition-based specifications are common-place in a...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...