403 search results - page 14 / 81 » A testing scenario for probabilistic processes |
ITC
2003
IEEE
15 years 6 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
112
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ICDE
2008
IEEE
15 years 7 months ago
2008
IEEE
— In the context of adaptive query processing (AQP), several techniques have been proposed for dynamically adapting/redistributing processor load assignments throughout a computa...
106
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VLSID
2007
IEEE
16 years 1 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
120
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CCS
1998
ACM
15 years 5 months ago
1998
ACM
We develop a framework for analyzing security protocols in which protocol adversaries may be arbitrary probabilistic polynomial-time processes. In this framework, protocols are wr...
KDD
2005
ACM
16 years 1 months ago
2005
ACM
In several organizations, it has become increasingly popular to document and log the steps that makeup a typical business process. In some situations, a normative workflow model o...