22 search results - page 3 / 5 » A unified MOSFET channel charge model for device modeling in... |
GECCO
2007
Springer
14 years 13 days ago
2007
Springer
In this paper, a new method for evolving simple electronic circuits is discussed, with the aim of improving the reliability and performance of basic circuit blocks. Next-generatio...
DAC
2006
ACM
14 years 7 days ago
2006
ACM
With the advent of carbon nanotube technology, evaluating circuit and system performance using these devices is becoming extremely important. In this paper, we propose a quasi-ana...
ISQED
2005
IEEE
13 years 12 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
ISCAS
2007
IEEE
14 years 16 days ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
ISCAS
2006
IEEE
14 years 8 days ago
2006
IEEE
— There are many kinds of optimization techniques for designing high-performance RF circuits. In this paper, we propose a new frequency-domain Spice-oriented optimization algorit...