Abstract--Test cost minimisation approaches have traditionally been devoted to minimising "execution costs", while maximising coverage or reliability. However, in a runti...
In this paper, we present an algorithm for finding utilitarian optimal solutions to Simple and Disjunctive Temporal Problems with Preferences (STPPs and DTPPs) based on Benders’...
Hossein M. Sheini, Bart Peintner, Karem A. Sakalla...
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
—Multi-objective optimization is an essential and challenging topic in the domains of engineering and computation because real-world problems usually include several conflicting...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...