168 search results - page 16 / 34 » Abstract Interpretation for Worst and Average Case Analysis |
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
INFOCOM
2007
IEEE
15 years 6 months ago
2007
IEEE
Abstract— This paper investigates the reliability of applicationlevel multicast based on a distributed hash table (DHT) in a highly dynamic network. Using a node residual lifetim...
ISQED
2007
IEEE
15 years 6 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
PERCOM
2009
ACM
15 years 6 months ago
2009
ACM
Abstract—Existing solutions for building wireless mesh networks suffer from reduced efficiency. This is due to lack of reliable self-configuration procedures that can dynamical...
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KDD
2003
ACM
16 years 4 days ago
2003
ACM
Defining outliers by their distance to neighboring examples is a popular approach to finding unusual examples in a data set. Recently, much work has been conducted with the goal o...