As sensing technologies become increasingly distributed and democratized, citizens and novice users are becoming responsible for the kinds of data collection and analysis that have...
Wesley Willett, Paul M. Aoki, Neil Kumar, Sushmita...
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
Abstract. Increasing logic resources coupled with a proliferation of integrated performance enhancing primitives in high-end FPGAs results in an increased design complexity which r...
N. Pete Sedcole, Peter Y. K. Cheung, George A. Con...
Background: Systematic, high-throughput studies of mouse phenotypes have been hampered by the inability to analyze individual animal data from a multitude of sources in an integra...
R. Brent Calder, Rudolf B. Beems, Harry van Steeg,...
—As Electronic Control Units (ECUs) and embedded software functions within an automobile keep increasing in number, the scale and complexity of automotive embedded systems is gro...