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KBSE
2007
IEEE
15 years 6 months ago
Directed test generation using symbolic grammars
We present CESE, a tool that combines exhaustive enumeration of test inputs from a structured domain with symbolic execution driven test generation. We target programs whose valid...
Rupak Majumdar, Ru-Gang Xu
121
Voted
DATE
2009
IEEE
90views Hardware» more  DATE 2009»
15 years 7 months ago
Property analysis and design understanding
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
Ulrich Kühne, Daniel Große, Rolf Drechs...
KBSE
1998
IEEE
15 years 4 months ago
An Automated Framework for Structural Test-Data Generation
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
Nigel Tracey, John A. Clark, Keith Mander, John A....
104
Voted
DATE
1997
IEEE
109views Hardware» more  DATE 1997»
15 years 4 months ago
Sequential circuit test generation using dynamic state traversal
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
140
Voted
ICST
2010
IEEE
14 years 11 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...