We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
Aimed at verifying safety properties and improving simulation coverage for hybrid systems models of embedded control software, we propose a technique that combines numerical simul...
Rajeev Alur, Aditya Kanade, S. Ramesh, K. C. Shash...
Testing is the primary software validation technique used by industry today, but remains ad hoc, error prone, and very expensive. A promising improvement is to automatically genera...
Anders Hessel, Kim Guldstrand Larsen, Brian Nielse...
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...