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92
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ITC
1997
IEEE
119views Hardware» more  ITC 1997»
15 years 4 months ago
Testability Analysis and ATPG on Behavioral RT-Level VHDL
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
ICSM
2005
IEEE
15 years 6 months ago
An Empirical Comparison of Test Suite Reduction Techniques for User-Session-Based Testing of Web Applications
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
Sara Sprenkle, Sreedevi Sampath, Emily Gibson, Lor...
94
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FMICS
2006
Springer
15 years 4 months ago
Test Coverage for Loose Timing Annotations
Abstract. The design flow of systems-on-a-chip (SoCs) identifies several abstraction levels higher than the Register-Transfer-Level that constitutes the input of the synthesis tool...
Claude Helmstetter, Florence Maraninchi, Laurent M...
GECCO
2007
Springer
174views Optimization» more  GECCO 2007»
15 years 6 months ago
Investigating data-flow coverage of classes using evolutionary algorithms
It is not unusual for a software development organization to expend 40 percent of total project effort on testing, which can be a very laborious and time-consuming process. Thus, ...
Konstantinos Liaskos, Marc Roper, Murray Wood
KBSE
2006
IEEE
15 years 6 months ago
Command-Form Coverage for Testing Database Applications
The testing of database applications poses new challenges for software engineers. In particular, it is difficult to thoroughly test the interactions between an application and it...
William G. J. Halfond, Alessandro Orso