106 search results - page 1 / 22 » Accurate Diagnosis of Multiple Faults |
95
Voted
ICCD
2005
IEEE
15 years 10 months ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
115
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ET
2006
15 years 1 months ago
2006
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
122
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ATS
2003
IEEE
15 years 6 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
DATE
2006
IEEE
15 years 7 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
106
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DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
- We describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selec...