32 search results - page 5 / 7 » Accurate Fault Modeling and Fault Simulation of Resistive Br... |
ATS
2010
IEEE
14 years 4 months ago
2010
IEEE
In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
DAC
2011
ACM
13 years 9 months ago
2011
ACM
Process Variation (PV) is increasingly threatening the reliability of Networks-on-Chips. Thus, various resilient router designs have been recently proposed and evaluated. However,...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
ATS
2004
IEEE
15 years 1 months ago
2004
IEEE
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...