Abstract An efficient and accurate numerical scheme is proposed, analyzed and implemented for the Kawahara and modified Kawahara equations which model many physical phenomena such ...
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
To overcome the complexity in System-on-Chip (SoC) design, researchers have developed sophisticated design flows that significantly reduce the development time through automation...
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
Calling context--the set of active methods on the stack--is critical for understanding the dynamic behavior of large programs. Dynamic program analysis tools, however, are almost ...