130 search results - page 11 / 26 » Accurate and scalable reliability analysis of logic circuits |
107
Voted
DSD
2007
IEEE
15 years 6 months ago
2007
IEEE
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
DAC
2012
ACM
13 years 2 months ago
2012
ACM
In this work, we propose a fast and accurate chip/package thermomechanical stress and reliability co-analysis tool for TSV-based 3D ICs. We also present a design optimization meth...
89
Voted
ISQED
2010
IEEE
15 years 4 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
ISQED
2006
IEEE
15 years 5 months ago
2006
IEEE
The continuing VLSI technology scaling leads to increasingly significant power supply fluctuations, which need to be modeled accurately in circuit design and verification. Meanwhi...
DAC
2007
ACM
16 years 20 days ago
2007
ACM
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...