130 search results - page 19 / 26 » Accurate and scalable reliability analysis of logic circuits |
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GLVLSI
2006
IEEE
15 years 5 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
118
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CODES
2005
IEEE
15 years 5 months ago
2005
IEEE
In this paper, we present the analysis, design and implementation of an estimator to realize large bit width unsigned integer multiplier units. Larger multiplier units are require...
TVLSI
2010
14 years 6 months ago
2010
Clock network is a vulnerable victim of variations as well as a main power consumer in many integrated circuits. Recently, link-based non-tree clock network attracts people's...
ICCD
2008
IEEE
15 years 8 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
111
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ICCAD
2003
IEEE
15 years 8 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...