130 search results - page 20 / 26 » Accurate and scalable reliability analysis of logic circuits |
ISLPED
2006
ACM
15 years 5 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DAC
2007
ACM
16 years 22 days ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
ICCAD
1996
IEEE
15 years 3 months ago
1996
IEEE
We present techniques for estimating switching activity and power consumption in register-transfer level (RTL) circuits. Previous work on this topic has ignored the presence of gl...
ASPDAC
2006
ACM
15 years 3 months ago
2006
ACM
- In this paper, we study the relationship between C4 package resonance effects and logical switching timing correlations, which has not been thoroughly investigated in the past. W...
VLSID
2009
IEEE
16 years 11 days ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...