130 search results - page 21 / 26 » Accurate and scalable reliability analysis of logic circuits |
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
– The quest for technologies with superior device characteristics has showcased Carbon Nanotube Field Effect Transistors (CNFETs) into limelight. Among the several design aspects...
ICCD
2007
IEEE
15 years 8 months ago
2007
IEEE
We have developed a new statistical timing analysis approach that does not impose any assumptions on the nature of manufacturing variability and takes into account an arbitrary mo...
DAC
2005
ACM
16 years 21 days ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
121
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TVLSI
2010
14 years 6 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
140
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DAC
2009
ACM
16 years 23 days ago
2009
ACM
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...