130 search results - page 8 / 26 » Accurate and scalable reliability analysis of logic circuits |
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DAC
2011
ACM
13 years 11 months ago
2011
ACM
In this work, we propose an efficient and accurate full-chip thermomechanical stress and reliability analysis tool and design optimization methodology to alleviate mechanical rel...
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
SBCCI
2006
ACM
15 years 5 months ago
2006
ACM
This paper presents the design of asynchronous circuits on synchronous FPGAs and CPLDs. Different design styles have been investigated through the implementation of dual-rail full...
DSD
2008
IEEE
15 years 6 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
GLVLSI
2009
IEEE
15 years 3 months ago
2009
IEEE
Mounting concerns over variability, defects and noise motivate a new approach for integrated circuits: the design of stochastic logic, that is to say, digital circuitry that opera...