81 search results - page 12 / 17 » Accurate microarchitecture-level fault modeling for studying... |
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
66
Voted
ISSRE
2002
IEEE
15 years 2 months ago
2002
IEEE
We report a study to determine the impact of four types of disturbances on the failure intensity of a software product undergoing system test. Hardware failures, discovery of a cr...
74
Voted
IAAI
2003
14 years 11 months ago
2003
In addition to being accurate, it is important that diagnostic systems for use in automobiles also have low development and hardware costs. Model-based methods have shown promise ...
ETS
2010
IEEE
14 years 8 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
AICCSA
2006
IEEE
14 years 11 months ago
2006
IEEE
In this paper we apply a machine learning approach to the problem of estimating the number of defects called Regression via Classification (RvC). RvC initially automatically discr...